The Landsat-5 (L5) Thematic Mapper (TM) detectors of the short wave infrared (SWIR) bands 5 and 7 are maintained on cryogenic temperatures to minimize thermal noise and allow adequate detection of scene energy. Over the instrument's lifetime, gain oscillations are observed in these bands that are caused by an ice-like contaminant that gradually builds up on the window of a dewar that houses these bands' detectors. This process of icing, an effect of material outgassing in space, is detected and characterized through observations of Internal Calibrator (IC) data. Analyses of IC data indicated three to five percent uncertainty in absolute gain estimates due to this icing phenomenon. The thin-film interference lifetime models implemented in the image product generation systems at the U.S. Geological Survey (USGS) Center for Earth Resources Observation and Science (EROS) successfully remove up to 80 percent of the icing effects for the image acquisition period from the satellite's launch in 1984 until 2001; however, their correction ability was found to be much lower for the time thereafter. This study concentrates on improving the estimates of the contaminant film growth rate and the associated change in the period of gain oscillations. The goal is to provide model parameters with the potential to correct 70 to 80 percent of gain uncertainties caused by outgassing effects in L5 TM bands 5 and 7 over the instrument's entire lifetime.
